New Zealand Scanning Electron Microscope (SEM)

A Scanning Electron Microscope (SEM) is used to produce highly magnified images by scanning a sample specimen with a high energy beam of electrons. Scattered electrons are detected and a high-resolution optical image is formed. The magnification factor of a SEM (up to 300,000 times) is considerably more powerful than optical (light) microscopes (up to 1,000 times). This makes it ideal for high detail surface imaging, characterization, composition, contaminations or for failure analysis. It is also useful for viewing surface morphology, investigating wear mechanisms and composite materials.

Optical SEM imaging services are provided by Rocket Lab at its laboratory in Parnell, Auckland, New Zealand. Rocket Lab operates a JEOL JSM-840 Scanning Electron Microscope (SEM), and Edwards S150 Splutter Coater, capable of producing high-detail optical images of a specimen surface.